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Please use this identifier to cite or link to this item: http://nbn-resolving.de/urn:nbn:de:hebis:34-2013103144365

Title: Thermal exchange bias field drifts after 10 keV He ion bombardment
Other Titles: Storage temperature dependence and initial number of coupling sites
Authors: Schmidt, ChristophWeis, TanjaEngel, DieterEhresmann, Arno
???metadata.dc.subject.ddc???: 530 - Physik (Physics)
Issue Date: 2011
Citation: In: Journal of applied physics. - Melville, NY : American Inst. of Physics, 2011, Vol. 110, 113911, 1-4
URI: urn:nbn:de:hebis:34-2013103144365
additional URI: doi:10.1063/1.3665198zdb:ZDB-1-AIPK
ISSN: 1089-7550
???metadata.dc.description.everything???: Dieser Beitrag ist mit Zustimmung des Rechteinhabers aufgrund einer (DFG-geförderten) Allianz- bzw. Nationallizenz frei zugänglich. - This publication is with permission of the rights owner freely accessible due to an Alliance licence and a national licence (funded by the DFG, German Research Foundation) respectively.
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